PULSCAN
PULSCAN
Innovative Solutions for Testing and Failure Analysis

PULSCAN provides state-of-the-art instrumentation and services for testing and failure analysis of semiconductor components and systems to manufacturers and users of integrated devices.

Rapid evolution of process technologies drives new needs for optical and electronic instruments. PULSCAN expertise and know-how address especially the following applications:

  • Single-Event Effects Testing
  • Design Debug
  • Defect localization
  • Yield improvement
  • Reliability evaluation
  • Part screening and qualification

 

PULSYS

PULSCAN is at IEEE NSREC 2017
Visit us on booth 508.
IEEE NSREC2017